Electron beam deposition for nanofabrication

Autor: W. F. van Dorp, Samantha G. Rosenberg, D. H. Fairbrother, Justin M. Gorham, Cornelis W. Hagen, J. D. Wnuk
Jazyk: angličtina
Rok vydání: 2011
Předmět:
Zdroj: Surface Science, 605(3-4), 257-266. ELSEVIER SCIENCE BV
Delft University of Technology
ISSN: 0039-6028
Popis: Electron beam induced deposition (EBID) is a direct-write lithographic technique that utilizes the dissociation of volatile precursors by a focused electron beam in a low vacuum environment to create nanostructures. Notable advantages of EBID over competing lithographic techniques are that it is a single step process that allows three-dimensional free-standing structures to be created, including features with single-nanometer scale dimensions. However, despite the inherent advantages of EBID, scientific and technological issues are impeding its development as an industrial nanofabrication tool. Perhaps the greatest single limitation of EBID is that metal-containing nanostructures deposited from organometallic precursors typically possess unacceptable levels of organic contamination which adversely affects the material's properties. In addition to the issue of purity, there is also a lack of understanding and quantitative information on the fundamental surface reactions and reaction cross-sections that are responsible for EBID. In this prospective, we describe how surface analytical techniques have begun to provide mechanistic and kinetic insights into the molecular level processes associated with EBID. This has been achieved by observing the effect of electron irradiation on nanometer thick films of organometallic precursors adsorbed onto solid substrates at low temperatures (
Databáze: OpenAIRE