From online fault detection to fault management in Network-on-Chips: A ground-up approach
Autor: | Thomas Hollstein, Raimund Ubar, Siavoosh Payandeh Azad, Behrad Niazmand, Karl Janson, Apneet Kaur, Adeboye Stephen Oyeniran, Tsotne Putkaradze, Jaan Raik, Nevin George, Gert Jervan |
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Rok vydání: | 2017 |
Předmět: |
010302 applied physics
Engineering business.industry Control reconfiguration Hardware_PERFORMANCEANDRELIABILITY 02 engineering and technology Fault (power engineering) 01 natural sciences Fault detection and isolation 020202 computer hardware & architecture Fault indicator Fault management Stuck-at fault Embedded system Software fault tolerance 0103 physical sciences Fault coverage 0202 electrical engineering electronic engineering information engineering business |
Zdroj: | DDECS 2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) |
DOI: | 10.1109/ddecs.2017.7934565 |
Popis: | Due to the ongoing miniaturization of silicon technology beyond the sub-micron domain and the trend of integrating ever more components on a single chip, the Network-on-Chip (NoC) paradigm has emerged to address the scalability and performance shortcomings of bus-based interconnects. As the feature size shrinks, the system gets much more susceptible to faults caused by wear-out and environmental effects. Thus, in order to increase the reliability, creates the need for having mechanisms embedded into such a system that could detect and manage the faults in run-time. In this paper, a ground-up approach from fault detection to fault management for such a NoC-based system on chip is proposed that utilizes both local fault management for fast reaction to faults and a global fault management mechanisms for triggering a large-scale reconfiguration of the NoC. Also, detailed description of strategies for fault detection, localization, classification and propagation to a global fault management unit are provided and methods for local fault management are elaborated. |
Databáze: | OpenAIRE |
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