Reduced-reference image quality metric based on statistic model in complex wavelet transform domain

Autor: Clency Perrine, Nanrun Zhou, Jianhua Wu, Yannis Pousset, Philippe Carré, Xinwen Xie
Přispěvatelé: XLIM (XLIM), Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS), Nanchang University
Jazyk: angličtina
Rok vydání: 2019
Předmět:
Zdroj: Signal Processing: Image Communication
Signal Processing: Image Communication, Elsevier, 2019, 74, pp.218-230. ⟨10.1016/j.image.2019.02.006⟩
ISSN: 0923-5965
1879-2677
DOI: 10.1016/j.image.2019.02.006⟩
Popis: A new Reduced-Reference (RR) image quality metric based on statistical models in the complex wavelet transform domain is proposed. The magnitude and the relative phase information of the complex wavelet coefficients is modeled by using probability density function, and a strategy based on the information criterion is proposed to optimally approximate the distribution. To further improve the accuracy of the metric, a comparison of the candidate models is studied, and the inverse Gaussian distribution and the wrapped Cauchy distribution are selected to model the magnitude and the relative phase distributions, respectively. The Kullback–Leibler divergence between the distributions of the reference image and the distorted one serves as the RR feature to measure the distortion. Finally, a generalized regression neural network is employed to map the RR feature into an objective score. Experimental studies confirmed that the proposed RR image quality metric is quality-aware and highly correlated with the human visual system.
Databáze: OpenAIRE