Study on the reflectivity properties of spherically bent analyser crystals
| Autor: | Simo Huotari, Giulio Monaco, Roberto Verbeni, M. Moretti Sala, Laura Simonelli, Ari-Pekka Honkanen |
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| Přispěvatelé: | Materials Physics, Department of Physics |
| Jazyk: | angličtina |
| Rok vydání: | 2014 |
| Předmět: |
Physics
Nuclear and High Energy Physics Radiation Field (physics) Scattering inelastic X-ray scattering Analyser Bent molecular geometry bent crystals high-energy-resolution analysers Instrumentation Mass spectrometry 114 Physical sciences Synchrotron law.invention Beamline law Physics::Accelerator Physics Atomic physics Anisotropy |
| Popis: | Theoretical and experimental studies are presented on properties of spherically bent analyser crystals for high-resolution X-ray spectrometry. A correction to the bent-crystal strain field owing to its finite surface area is derived. The results are used to explain the reflectivity curves and anisotropic properties of Si(660) and Si(553) analysers in near-backscattering geometry. The results from the calculation agree very well with experimental results obtained using an inelastic X-ray scattering synchrotron beamline. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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