Improved performance of semiconductor laser tracking frequency gauge
| Autor: | Daniel M. Kaplan, Robert D. Reasenberg, James D. Phillips, Thomas Roberts |
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| Jazyk: | angličtina |
| Rok vydání: | 2017 |
| Předmět: |
Atomic Physics (physics.atom-ph)
FOS: Physical sciences Tracking (particle physics) 01 natural sciences law.invention High Energy Physics - Experiment Physics - Atomic Physics 010309 optics High Energy Physics - Experiment (hep-ex) Optics law 0103 physical sciences Instrumentation Instrumentation and Methods for Astrophysics (astro-ph.IM) Mathematical Physics Physics 010308 nuclear & particles physics business.industry Picometre Gauge (firearms) Laser Exoplanet Improved performance Interferometry Semiconductor business Astrophysics - Instrumentation and Methods for Astrophysics |
| Popis: | We describe new results from the semiconductor-laser tracking frequency gauge, an instrument that can perform sub-picometer distance measurements and has applications in gravity research and in space-based astronomical instruments proposed for the study of light from extrasolar planets. Compared with previous results, we have improved incremental distance accuracy by a factor of two, to 0.9 pm in 80 s averaging time, and absolute distance accuracy by a factor of 20, to 0.17 $\mu$m in 1000 s. After an interruption of operation of a tracking frequency gauge used to control a distance, it is now possible, using a nonresonant measurement interferometer, to restore the distance to picometer accuracy by combining absolute and incremental distance measurements. Comment: 8 pages, 4 figures. To appear in JINST. (This version with new figures 3 and 4 with improved graphic quality and performance.) |
| Databáze: | OpenAIRE |
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