Temporal electronic speckle pattern interferometry for real-time in-plane rotation analysis
Autor: | Shengjia Wang, Laura Maria Bilgeri, Martin Jakobi, Alexander W. Koch, Min Lu, Félix Salazar Bloise |
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Rok vydání: | 2018 |
Předmět: |
Physics
business.industry Phase (waves) 02 engineering and technology 021001 nanoscience & nanotechnology 01 natural sciences Atomic and Molecular Physics and Optics Intensity (physics) 010309 optics Light intensity Optics Electronic speckle pattern interferometry 0103 physical sciences 0210 nano-technology Phase retrieval business Rotation (mathematics) Phase modulation Sign (mathematics) |
Zdroj: | Optics express. 26(7) |
ISSN: | 1094-4087 |
Popis: | A temporal electronic speckle pattern interferometry (ESPI) system is proposed for in-plane rotation measurement. The relationship between the rotation angle and the phase change distribution is established and the rotation direction is indicated by the sign of the partial differential of the phase change distribution. Temporal phase modulation is applied in the proposed symmetric illumination ESPI system. The phase is recovered by the temporal intensity analysis method which uses the temporal evolution history of the light intensity. The system can perform dynamic measurements and provide results in off-line real-time. Preliminary experiments were carried out with a continuously rotating target to show the feasibility and the dynamic feature of the temporal ESPI system. At present, the mean absolute error of the experiment is 0.39 arcsec. |
Databáze: | OpenAIRE |
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