| Autor: |
H.-J. Kutschera, M. Streibl, Florian W. Beil, C. Bodefeld, Achim Wixforth |
| Rok vydání: |
2002 |
| Předmět: |
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| Zdroj: |
2001 IEEE Ultrasonics Symposium. Proceedings. An International Symposium (Cat. No.01CH37263). |
| DOI: |
10.1109/ultsym.2001.991596 |
| Popis: |
A new method to optically examine surface acoustic wave (SAW) propagation on a semiconductor chip is presented. This visualization method is based on the influence of a SAW on the optical properties of a piezoelectric semiconductor. There are two interaction mechanisms between the SAW and photo generated carriers that allow one to correlate the photoluminescence (PL) to the power of the SAW: First exciton dissociation leads to a reduction of the PL and second trapped charge carriers can be released leading to an enhancement of the PL. In the experiment we use a gated and intensified CCD camera to directly record light coming from the sample. With our setup we are able to display the temporal and spatial distribution of SAW fields with a resolution of 300 ps and 1 /spl mu/m respectively. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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