Characterization of Amorphous Oxide Nano-Thick Layers on 316L Stainless Steel by Electron Channeling Contrast Imaging and Electron Backscatter Diffraction
| Autor: | Raynald Gauvin, Diego Mantovani, Pascale Chevallier, Maxime Cloutier, Mahrokh Dorri, Stéphane Turgeon, Nicolas Brodusch |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
010302 applied physics
Reflection high-energy electron diffraction Materials science business.industry Oxide 02 engineering and technology Substrate (electronics) 021001 nanoscience & nanotechnology 01 natural sciences Amorphous solid chemistry.chemical_compound Optics chemistry X-ray photoelectron spectroscopy 0103 physical sciences Crystallite Composite material 0210 nano-technology business Instrumentation Layer (electronics) Electron backscatter diffraction |
| Zdroj: | Microscopy and Microanalysis. 22:997-1006 |
| ISSN: | 1435-8115 1431-9276 |
| Popis: | Characterization of the topmost surface of biomaterials is crucial to understanding their properties and interactions with the local environment. In this study, the oxide layer microstructure of plasma-modified 316L stainless steel (SS316L) samples was analyzed by a combination of electron backscatter diffraction and electron channeling contrast imaging using low-energy incident electrons. Both techniques allowed clear identification of a nano-thick amorphous oxide layer, on top of the polycrystalline substrate, for the plasma-modified samples. A methodology was developed using Monte Carlo simulations combined with the experimental results to estimate thickness of the amorphous layer for different surface conditions. X-ray photoelectron spectroscopy depth profiles were used to validate these estimations. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|