Numerical Analysis of Gate-All-Around HfO2/TiO2/HfO2 High-K Dielectric Based WSe2 NCFET With Reduced Sub-Threshold Swing and High On/Off Ratio

Autor: Catherine Stampfl, Md. Sherajul Islam, Kamal Hosen, Jeongwon Park
Jazyk: angličtina
Rok vydání: 2021
Předmět:
Zdroj: IEEE Access, Vol 9, Pp 116254-116264 (2021)
ISSN: 2169-3536
Popis: Gate-all-around (GAA) field effect transistors (FETs) have appeared as one of the potential candidates for the electrostatic integrity required to reduce MOSFETs to minimum channel lengths. Meanwhile, the negative capacitance effect of ferroelectrics is known as a remarkable quality enhancer for MOSFETs in terms of reducing sub-threshold slope (SS), supply voltage, and power consumption by utilizing the gate voltage amplification phenomenon. In this work, combining these two phenomena we numerically design a cylindrical GAA NCFET where promising two-dimensional WSe2 is used as a channel material. We have suggested a high-K dielectric consisting of a tri-layer HfO2/TiO2/HfO2 and lead zirconate titanate (PZT) as a ferroelectric layer in the gate stacking. The extremely high $I_{on}/I_{off}$ ratio on the order of 1012 (six order higher than conventional FET), and the high on-state current of $119~\mu \text{A}$ are the most remarkable findings of this device which exceeds all the earlier results. The integration of the NC effect utilizing a 20 nm PZT offers lowest $SS$ of 18.9 mV/dec. Moreover, a large transconductance ( $g_{m}$ ) of $117~\mu \text{S}$ and a higher current cut-off frequency ( $f_{T}$ ) of 335 GHz were reported from the output characteristics. These outcomes allude that the suggested device structure may create a new path for electronic devices; therefore, it can be used for high speed operation with low power consumption.
Databáze: OpenAIRE