Is fast mapping good mapping? A review of the benefits of high-speed orientation mapping using electron backscatter diffraction

Autor:	A Day, K. Mehnert, Patrick Trimby, N H Schmidt
Rok vydání:	2002
Předmět:	Histology Computer science Orientation (computer vision) business.industry Boundary (topology) Pathology and Forensic Medicine Fast mapping Characterization (materials science) Crystallography Software Grain boundary Texture (crystalline) business Algorithm Electron backscatter diffraction
Zdroj:	Journal of Microscopy. 205:259-269
ISSN:	1365-2818 0022-2720
DOI:	10.1046/j.1365-2818.2002.00995.x
Popis:	Orientation mapping using automated electron backscatter diffraction (EBSD) is now a common technique for characterizing microstructures. Improvements in software and hardware have resulted in high-speed mapping capabilities above 80,000 points h(-1). For 'routine' microstructural analyses of materials such as steel and aluminium (e.g. texture and grain size measurements and high angle boundary characterization), high-speed orientation mapping is an ideal approach with minimal penalty on the final statistics. However, for the accurate analysis of very low angle boundaries and for routine analyses of more difficult materials (e.g. most rock samples), we advocate a more patient approach to orientation mapping with an emphasis on data accuracy and reliability. It is important that the objectives of any EBSD analysis are carefully considered before starting--in this way the maximum potential of an EBSD system can be achieved.
Databáze:	OpenAIRE
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