An Accurate Characterization Method for Integrated Polarization Converters
| Autor: | Yuqing Jiao, Kevin A. Williams, Jos J. G. M. van der Tol, Sander Reniers |
|---|---|
| Přispěvatelé: | Photonic Integration |
| Rok vydání: | 2021 |
| Předmět: |
Silicon nitride
Materials science Fabrication Loss measurement Nanophotonics 02 engineering and technology Indium phosphide Photonic integrated circuits III-V semiconductor materials 020210 optoelectronics & photonics 0202 electrical engineering electronic engineering information engineering Insertion loss Electrical and Electronic Engineering Polarization (electrochemistry) Couplers Gratings polarization converters polarization Extinction ratio business.industry Photonic integrated circuit Energy conversion efficiency Converters Condensed Matter Physics Atomic and Molecular Physics and Optics photonic crystals nanophotonics Optoelectronics business |
| Zdroj: | IEEE Journal of Quantum Electronics, 57(1):9311824. Institute of Electrical and Electronics Engineers |
| ISSN: | 1558-1713 0018-9197 |
| Popis: | We present a characterization method for polarization converters which improves the accuracy of traditional characterization methods significantly. An experimental demonstration of the method is presented on the InP-membrane-on-silicon (IMOS) platform. The design and fabrication of the polarization converter is discussed, as well as the simulated polarization conversion efficiency. A device of only 4 microns is shown to achieve 97.5%±0.5% polarization conversion, corresponding to an extinction ratio of -16± 0.9 dB. The traditional characterization method is compared to the new 4-port method, and the accuracy is improved from up to 20% to 0.5%. |
| Databáze: | OpenAIRE |
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