Simulation and measurement of interconnects and on-chip passives : gauge fields and ghosts as numerical tools

Autor:	Schoenmaker, W., Meuris, P., Janssens, E., Verschaeve, M., Seebacher, E., Pflanzl, W., Stucchi, M., Mandeep, B., Maex, K., Schilders, W.H.A., Di Bucchianico, A., Mattheij, R.M.M., Peletier, M.A.
Přispěvatelé:	Scientific Computing
Jazyk:	angličtina
Rok vydání:	2006
Předmět:	Physics Computer simulation Lattice (order) visual_art High Energy Physics::Lattice Electronic component Electronic engineering visual_art.visual_art_medium Experimental data Faddeev–Popov ghost Field methods
Zdroj:	Progress in Industrial Mathematics at ECMI 2004 (Proceedings 13th European Conference on Mathematics for Industry, Eindhoven, The Netherlands, June 21-25, 2004), 57-73 STARTPAGE=57;ENDPAGE=73;TITLE=Progress in Industrial Mathematics at ECMI 2004 (Proceedings 13th European Conference on Mathematics for Industry, Eindhoven, The Netherlands, June 21-25, 2004) Progress in Industrial Mathematics at ECMI 2004 ISBN: 9783540280729
ISSN:	1612-3956
DOI:	10.1007/3-540-28073-1_6
Popis:	This paper describes the present status of using lattice gauge and ghost field methods for the simulation of on-chip interconnects and integrated passive components at low and high frequencies. Test structures have been developed and characterized in order to confront the simulation techniques with experimental data. The solution method gives results that are in agreement with the measurements.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e46fa6f6f3f4015a5ca1ea4c5654e5f5 https://doi.org/10.1007/3-540-28073-1_6 Zobrazit plný text záznamu