A direct electron detector for time-resolved MeV electron microscopy
| Autor: | Peter Denes, Jie Yang, John Joseph, Xiaozhe Shen, D. Zhang, Stephen Weathersby, A. Perazzo, Renkai Li, R.K. Jobe, Theodore Vecchione, Ian Johnson, Xijie Wang |
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| Rok vydání: | 2017 |
| Předmět: |
Materials science
Physics::Instrumentation and Detectors business.industry Dynamic range Detector Nanotechnology 02 engineering and technology Cryogenics Electron 021001 nanoscience & nanotechnology 01 natural sciences Noise (electronics) law.invention Optics law 0103 physical sciences Electron microscope 010306 general physics 0210 nano-technology business Instrumentation Image resolution Jitter |
| Zdroj: | Review of Scientific Instruments. 88:033702 |
| ISSN: | 1089-7623 0034-6748 |
| Popis: | The introduction of direct electron detectors enabled the structural biology revolution of cryogenic electron microscopy. Direct electron detectors are now expected to have a similarly dramatic impact on time-resolved MeV electron microscopy, particularly by enabling both spatial and temporal jitter correction. Here we report on the commissioning of a direct electron detector for time-resolved MeV electron microscopy. The direct electron detector demonstrated MeV single electron sensitivity and is capable of recording megapixel images at 180 Hz. The detector has a 15-bit dynamic range, better than 30-μm spatial resolution and less than 20 analogue-to-digital converter count RMS pixel noise. The unique capabilities of the direct electron detector and the data analysis required to take advantage of these capabilities are presented. The technical challenges associated with generating and processing large amounts of data are also discussed. |
| Databáze: | OpenAIRE |
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