Optical Sectioning and High Resolution in Single-Slice Structured Illumination Microscopy by Thick Slice Blind-SIM Reconstruction
| Autor: | Aurélie Jost, Rainer Heintzmann, Polina Feldmann, Elen Tolstik, Kai Wicker, Anne Sentenac |
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| Přispěvatelé: | Institute of Physical Chemistry, Abbe Center of Photonics, Friedrich-Schiller-Universität = Friedrich Schiller University Jena [Jena, Germany], Leibniz-Institute of Photonic Technology, Carl Zeiss AG, Corporate Research and Technology, SEMO (SEMO), Institut FRESNEL (FRESNEL), Centre National de la Recherche Scientifique (CNRS)-École Centrale de Marseille (ECM)-Aix Marseille Université (AMU)-Centre National de la Recherche Scientifique (CNRS)-École Centrale de Marseille (ECM)-Aix Marseille Université (AMU), King‘s College London, Aix Marseille Université (AMU)-École Centrale de Marseille (ECM)-Centre National de la Recherche Scientifique (CNRS)-Aix Marseille Université (AMU)-École Centrale de Marseille (ECM)-Centre National de la Recherche Scientifique (CNRS) |
| Rok vydání: | 2015 |
| Předmět: |
Materials science
Microscope Optical sectioning [SDV.IB.IMA]Life Sciences [q-bio]/Bioengineering/Imaging [SDV]Life Sciences [q-bio] lcsh:Medicine Breast Neoplasms 02 engineering and technology 01 natural sciences law.invention 010309 optics Optics law Cell Line Tumor 0103 physical sciences Humans Köhler illumination lcsh:Science Lighting [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics] Multidisciplinary business.industry lcsh:R Optical Imaging Resolution (electron density) Bright-field microscopy FLUORESCENCE MICROSCOPY Reconstruction algorithm 021001 nanoscience & nanotechnology Actins LIGHT Cardinal point Microscopy Fluorescence Light sheet fluorescence microscopy [SPI.OPTI]Engineering Sciences [physics]/Optics / Photonic lcsh:Q Female Paxillin Artifacts 0210 nano-technology business [SPI.SIGNAL]Engineering Sciences [physics]/Signal and Image processing Algorithms Research Article |
| Zdroj: | PLoS ONE PLoS ONE, Public Library of Science, 2015, 10, pp.e0132174. ⟨10.1371/journal.pone.0132174⟩ PLoS ONE, Vol 10, Iss 7, p e0132174 (2015) PLoS ONE, 2015, 10, pp.e0132174. ⟨10.1371/journal.pone.0132174⟩ |
| ISSN: | 1932-6203 |
| DOI: | 10.1371/journal.pone.0132174 |
| Popis: | International audience; The microscope image of a thick fluorescent sample taken at a given focal plane is plagued by out-of-focus fluorescence and diffraction limited resolution. In this work, we show that a single slice of Structured Illumination Microscopy (two or three beam SIM) data can be processed to provide an image exhibiting tight sectioning and high transverse resolution. Our reconstruction algorithm is adapted from the blind-SIM technique which requires very little knowledge of the illumination patterns. It is thus able to deal with illumination distortions induced by the sample or illumination optics. We named this new algorithm thick slice blind-SIM because it models a three-dimensional sample even though only a single two-dimensional plane of focus was measured. |
| Databáze: | OpenAIRE |
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