Thermo-voltage measurements of atomic contacts at low temperature
| Autor: | León Martin, Ayelet Ofarim, Elke Scheer, Bastian Kopp, Johannes Boneberg, Thomas B. Möller, Paul Leiderer |
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| Jazyk: | angličtina |
| Rok vydání: | 2016 |
| Předmět: |
Materials science
Kelvin Laser source Analytical chemistry General Physics and Astronomy 02 engineering and technology atomic contacts low temperature lcsh:Chemical technology 01 natural sciences lcsh:Technology Full Research Paper Finite element simulation temperature determination finite element simulations laser heating mechanically controllable break-junction thermopower Seebeck coefficient 0103 physical sciences Nanotechnology ddc:530 General Materials Science lcsh:TP1-1185 Electrical and Electronic Engineering 010306 general physics lcsh:Science Condensed matter physics lcsh:T 021001 nanoscience & nanotechnology lcsh:QC1-999 Nanoscience Junction temperature lcsh:Q Laser heating 0210 nano-technology Break junction lcsh:Physics Voltage |
| Zdroj: | Beilstein Journal of Nanotechnology, Vol 7, Iss 1, Pp 767-775 (2016) Beilstein Journal of Nanotechnology |
| ISSN: | 2190-4286 |
| Popis: | We report the development of a novel method to determine the thermopower of atomic-sized gold contacts at low temperature. For these measurements a mechanically controllable break junction (MCBJ) system is used and a laser source generates a temperature difference of a few kelvins across the junction to create a thermo-voltage. Since the temperature difference enters directly into the Seebeck coefficient S = −ΔV/ΔT, the determination of the temperature plays an important role. We present a method for the determination of the temperature difference using a combination of a finite element simulation, which reveals the temperature distribution of the sample, and the measurement of the resistance change due to laser heating of sensor leads on both sides next to the junction. Our results for the measured thermopower are in agreement with recent reports in the literature. |
| Databáze: | OpenAIRE |
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