Application of terahertz Gouy phase shift from curved surfaces for estimation of crop yield
| Autor: | John F. Federici, Suman Mukherjee, David E. Rodriguez, Robert L. Wample |
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| Rok vydání: | 2009 |
| Předmět: |
Surface (mathematics)
Materials science Terahertz radiation business.industry Plane (geometry) Materials Science (miscellaneous) Detector Physics::Optics Industrial and Manufacturing Engineering Terahertz spectroscopy and technology Cardinal point Optics Reflection (physics) Business and International Management Spectroscopy business |
| Zdroj: | Applied Optics. 48:1382 |
| ISSN: | 1539-4522 0003-6935 |
| DOI: | 10.1364/ao.48.001382 |
| Popis: | The application of terahertz time-domain spectroscopy (THz-TDS) and imaging to differentiate flat and curved surfaces in reflection via the THz Gouy phase shift is demonstrated. For a THz-TDS system that is aligned for reflection from a flat surface, the presence of a curved surface displaces the image focal plane from the detector plane, resulting in a Gouy phase shift. The potential of utilizing this configuration for estimating the number and size of curved objects is discussed with particular emphasis on agriculture crop yield estimates. |
| Databáze: | OpenAIRE |
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