Barkhausen noise analysis of thin film ferroelectrics

Autor: Hiroshi Funakubo, Keisuke Yazawa, Benjamin Ducharne, John E. Blendell, Hiroshi Uchida
Přispěvatelé: Purdue University [West Lafayette], Laboratoire de Génie Electrique et Ferroélectricité (LGEF), Institut National des Sciences Appliquées de Lyon (INSA Lyon), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Université de Lyon-Institut National des Sciences Appliquées (INSA), Sophia University [Tokyo], Tokyo Institute of Technology [Tokyo] (TITECH)
Rok vydání: 2020
Předmět:
Zdroj: Applied Physics Letters
Applied Physics Letters, American Institute of Physics, 2020, 117 (1), pp.012902. ⟨10.1063/5.0012635⟩
ISSN: 1077-3118
0003-6951
DOI: 10.1063/5.0012635
Popis: International audience; The first direct Barkhausen noise measurement in a ferroelectric thin film is presented. The Barkhausen noise energy loop is reconstructed from the measured Barkhausen noise and is closely related to the classic ferroelectric P vs E hysteresis loop. Grain boundaries act as a dominant ferroelectric domain wall pinning site in a polycrystalline thin film based on the calculated domain wall jump distance using the Barkhausen noise frequency. The technique is promising for the measurement of ferroelectric switching dynamics, and provides a physical insight for improving application performance.
Databáze: OpenAIRE