Capillary-force-induced collapse lithography for controlled plasmonic nanogap structures

Autor: Younghwan Yang, Inki Kim, Wooseup Hwang, Junsuk Rho, Jungho Mun
Rok vydání: 2020
Předmět:
Zdroj: Microsystems & Nanoengineering, Vol 6, Iss 1, Pp 1-9 (2020)
ISSN: 2055-7434
Popis: The capillary force effect is one of the most important fabrication parameters that must be considered at the micro/nanoscale because it is strong enough to deform micro/nanostructures. However, the deformation of micro/nanostructures due to such capillary forces (e.g., stiction and collapse) has been regarded as an undesirable and uncontrollable obstacle to be avoided during fabrication. Here, we present a capillary-force-induced collapse lithography (CCL) technique, which exploits the capillary force to precisely control the collapse of micro/nanostructures. CCL uses electron-beam lithography, so nanopillars with various shapes can be fabricated by precisely controlling the capillary-force-dominant cohesion process and the nanopillar-geometry-dominant collapse process by adjusting the fabrication parameters such as the development time, electron dose, and shape of the nanopillars. CCL aims to achieve sub-10-nm plasmonic nanogap structures that promote extremely strong focusing of light. CCL is a simple and straightforward method to realize such nanogap structures that are needed for further research such as on plasmonic nanosensors. An innovative technique—capillary-force-induced collapse lithography (CCL)—has been developed to easily fabricate plasmonic nano-gap structures, which with a nano-gap of
Databáze: OpenAIRE