Electron inducing soft errors in 28 nm system-on-Chip
| Autor: | Jia-Nan Wei, Yaxin Guo, Boyang Du, Chaohui He, Weidong Zhang, Kesheng Chen, Yonghong Li, Sterpone Luca, Yang Li, Weitao Yang, Gang Guo, Zhao Haoyu |
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| Jazyk: | angličtina |
| Rok vydání: | 2020 |
| Předmět: |
010302 applied physics
electron Nuclear and High Energy Physics Hardware_MEMORYSTRUCTURES Radiation Materials science cross section business.industry 02 engineering and technology Electron soft error 021001 nanoscience & nanotechnology Condensed Matter Physics 01 natural sciences Cross section (physics) Optics Soft error 0103 physical sciences system-on-chip General Materials Science System on a chip Irradiation 0210 nano-technology business |
| Popis: | The 28 nm system-on-chip (SoC) was irradiated by 12 MeV electron at the China Institute of Atomic Energy (CIAE) for the first time. Soft errors in the on-chip memory (OCM), D-Cache, Register and BR... |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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