Influence of Periodic Surface Nanopatterning Profiles on Series Resistance in Thin-Film Crystalline Silicon Heterojunction Solar Cells
Autor: | Islam Abdo, Christos Trompoukis, Ivan Gordon, Ounsi El Daif, Loic Tous, Valerie Depauw, Rafik Guindi |
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Rok vydání: | 2015 |
Předmět: |
Condensed Matter - Materials Science
Materials science Silicon business.industry Contact resistance Materials Science (cond-mat.mtrl-sci) FOS: Physical sciences chemistry.chemical_element Heterojunction Condensed Matter Physics Electronic Optical and Magnetic Materials Indium tin oxide law.invention Optics chemistry law Solar cell Optoelectronics Crystalline silicon Electrical and Electronic Engineering Thin film business Sheet resistance |
Zdroj: | IEEE Journal of Photovoltaics. 5:1319-1324 |
ISSN: | 2156-3403 2156-3381 |
Popis: | In the frame of the development of thin crystalline silicon solar cell technologies, surface nanopatterning of silicon is gaining importance. Its impact on the material quality is, however, not yet fully controlled.We investigate here the influence of surface nanotexturing on the series resistance of a contacting scheme relevant for thin-film crystalline silicon heterojunction solar cells. Two dimensional periodic nanotextures are fabricated using a combination of nanoimprint lithography and either dry or wet etching, while random pyramid texturing is used for benchmarking. We compare these texturing techniques in terms of their effect on the series resistance of a solar cell through a study of the sheet resistance (Rsh ) and contact resistance (Rc) of its front layers, i.e., a sputtered transparent conductive oxide and evaporated metal contacts. We have found by four-point probe and the transfer length methods that dry-etched nanopatterns render the highest Rsh and Rc values. Wet-etched nanopatterns, on the other hand, have less impact on Rc and render Rsh similar to that obtained from the nontextured case. Authors' post-print version in Abdo et al., IEEE Journal of Photovoltaics, July 2015 |
Databáze: | OpenAIRE |
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