Field Ion Emission in an Atom Probe Microscope Triggered by Femtosecond-Pulsed Coherent Extreme Ultraviolet Light()
| Autor: | Norman A. Sanford, Benjamin W. Caplins, David R. Diercks, Brian P. Gorman, Paul T. Blanchard, Ann N. Chiaramonti, Luis Miaja-Avila |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 2020 |
| Předmět: |
010302 applied physics
Materials science Microscope Photon Extreme ultraviolet lithography 02 engineering and technology Atom probe Photon energy 021001 nanoscience & nanotechnology 01 natural sciences Article law.invention law Extreme ultraviolet Ionization 0103 physical sciences High harmonic generation Astrophysics::Solar and Stellar Astrophysics Atomic physics 0210 nano-technology Instrumentation |
| Zdroj: | Microsc Microanal |
| Popis: | This paper describes initial experimental results from an extreme ultraviolet (EUV) radiation-pulsed atom probe microscope. Femtosecond-pulsed coherent EUV radiation of 29.6 nm wavelength (41.85 eV photon energy), obtained through high harmonic generation in an Ar-filled hollow capillary waveguide, successfully triggered controlled field ion emission from the apex of amorphous SiO2 specimens. The calculated composition is stoichiometric within the error of the measurement and effectively invariant of the specimen base temperature in the range of 25 K to 150 K. Photon energies available in the EUV band are significantly higher than those currently used in the state-of-the-art near-ultraviolet laser-pulsed atom probe, which enables the possibility of additional ionization and desorption pathways. Pulsed coherent EUV light is a new and potential alternative to near-ultraviolet radiation for atom probe tomography. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|