Optical properties of scandium thin films
| Autor: | N. Zema, M. Sigrist, M. Piacentini, J.C. Francois, G. Chassaing, F Antonangeli |
|---|---|
| Rok vydání: | 1987 |
| Předmět: |
Materials science
synchrotron radiation business.industry scandium Bremsstrahlung Analytical chemistry chemistry.chemical_element Synchrotron radiation medicine.disease_cause OPTICAL CONSTANTS Electromagnetic radiation thin films infrared spectroscopy Optics chemistry Transition metal medicine Scandium Thin film business Layer (electronics) Ultraviolet |
| Zdroj: | Physical review. B, Condensed matter. 35(8) |
| ISSN: | 0163-1829 |
| Popis: | A new investigation of the optical properties of scandium is presented. Near-normal-incidence reflectivity measurements were performed from 0.22 to 5.5 eV on polycrystalline thin films evaporated in situ in ultrahigh vacuum. The reflectivity, from 0.22 to 35 eV, of the same samples after they had been exposed to air was also measured. The ultraviolet reflectivity was affected by oxygen contamination and a structure around 21 eV was recognized as due to the surface oxide layer. The structures below 5 eV were assigned to pure scandium metal. The interband part of the dielectric tensor was calculated from the electron energy bands presented by Das and good agreement was found with the experimental curves. |
| Databáze: | OpenAIRE |
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