Vector diffraction from subwavelength optical disk structures: two-dimensional modeling of near-field profiles, far-field intensities, and detector signals from a DVD
| Autor: | Wei Chih Liu, Marek W. Kowarz |
|---|---|
| Rok vydání: | 2008 |
| Předmět: |
Diffraction
Electromagnetic field Physics 3D optical data storage business.industry Materials Science (miscellaneous) Detector Physics::Optics Photodetector Near and far field Industrial and Manufacturing Engineering Optics Business and International Management business Optical disc Fresnel diffraction |
| Zdroj: | Applied optics. 38(17) |
| ISSN: | 1559-128X |
| Popis: | Rigorous two-dimensional vector-diffraction patterns of a focused beam incident on an optical disk, specifically, a digital versatile disk (DVD), are examined both in the near field and in the far field. An efficient finite-difference frequency-domain method is developed for calculating the electromagnetic fields in the neighborhood of subwavelength dielectric and metallic structures. The results of vector-diffraction theory are compared with those of scalar-diffraction theory for pressed DVD features that consist of pits or of bumps. The sum (data) and difference (tracking) signals from a split photodetector are also calculated for different disk features and for different polarizations. The subwavelength features of a DVD result in considerable vector-diffraction effects both in the near-field profiles and in the detector signals, depending not only on the polarization of illumination but also on whether the features are pits or bumps. This paper provides important insight into the vector-diffraction effects encountered in high-density optical data storage systems. |
| Databáze: | OpenAIRE |
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