Radiation‐induced interface phenomena: Decoration of high‐energy density ion tracks

Autor:	Thomas A. Tombrello, C. W. Nieh, P. Anders Ingemarsson, Bo U. R. Sundqvist
Rok vydání:	1989
Předmět:	Physics and Astronomy (miscellaneous) Chemistry Ion track Mineralogy Adhesion Molecular physics law.invention Ion Transmission electron microscopy law Microscopy Irradiation Thin film Electron microscope Caltech Library Services
Zdroj:	Applied Physics Letters. 54:1513-1515
ISSN:	1077-3118 0003-6951
DOI:	10.1063/1.101383
Popis:	The effect of 20 MeV Cl4 + ions incident on Au-SiO2 and Ag-SiO2 interfaces was investigated using high-resolution transmission electron microscopy. Cross-sectional micrographs expose beam-induced gold interfacial transport and migration into the SiO2. No such migration was observed for silver films. The relevance of this phenomenon to the adhesion improvement found at corresponding irradiation doses is discussed.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::de55d9028cef9a83b85c9607b3a9ba55 https://doi.org/10.1063/1.101383 Zobrazit plný text záznamu