Spectral characterization of nanostructured birefringent porous silicon
| Autor: | Shlomo Ruschin, Keren Hakshur, Yuval Yifat, Amit Levin |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
Polarized light microscopy
Materials science Birefringence business.industry Materials Science (miscellaneous) Degree of coherence Porous silicon Polarization (waves) Physical optics Industrial and Manufacturing Engineering Spectral line Superposition principle Optics Business and International Management business |
| Zdroj: | Applied optics. 54(36) |
| ISSN: | 1539-4522 |
| Popis: | We present measurements and analysis of the reflection spectrum of white light from a highly birefringent porous silicon layer at different polarization states. We report an anomalous pattern in the spectrum of linearly polarized light at 45° with respect to the principal axes of the layer. This spectrum comprises a combination of two interference effects, namely the Fabry-Perot-type multiple-beam interference present in a simple thin film, and a two-wave interference caused by the beat of two combined orthogonally polarized waves propagating in the birefringent medium. We perform a Fourier analysis of the measured reflected spectra. This analysis furnishes a powerful tool in order to separate the two interference mechanisms and determine the degree of coherence of their superposition. |
| Databáze: | OpenAIRE |
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