Using binary decision diagrams to speed up the test pattern generation of behavioral circuit descriptions written in hardware description languages
| Autor: | J.-F. Santucci, L. Vandeventer |
|---|---|
| Přispěvatelé: | EERIE, IMT - MINES ALES (IMT - MINES ALES), Institut Mines-Télécom [Paris] (IMT)-Institut Mines-Télécom [Paris] (IMT), Sciences pour l'environnement (SPE), Centre National de la Recherche Scientifique (CNRS)-Université Pascal Paoli (UPP), IEEE |
| Rok vydání: | 2002 |
| Předmět: |
Speedup
Theoretical computer science Binary decision diagram Programming language Computer science 020208 electrical & electronic engineering Hardware description language 02 engineering and technology Automatic test pattern generation computer.software_genre [INFO.INFO-MO]Computer Science [cs]/Modeling and Simulation Circuit extraction 020202 computer hardware & architecture Stuck-at fault Digital pattern generator 0202 electrical engineering electronic engineering information engineering [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics computer Register-transfer level computer.programming_language |
| Zdroj: | ISCAS Proceedings of the IEEE International Symposium on Circuits and Systems, 1994. ISCAS '94 IEEE International Symposium on Circuits and Systems, 1994. ISCAS '94 IEEE International Symposium on Circuits and Systems, 1994. ISCAS '94, 1994, London, United Kingdom. pp.279-282, ⟨10.1109/ISCAS.1994.408809⟩ |
| ISSN: | 7803-1915 |
| DOI: | 10.1109/iscas.1994.408809 |
| Popis: | ISBN: 0-7803-1915-X website : http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?isnumber=9169&arnumber=408809&count=123&index=69; International audience; In this paper, we focus on test pattern generation for circuit descriptions written in hardware description languages according to the circuit behavior. We develop an algorithmic improvement method which is devoted to speed up the deterministic and fault-oriented test systems which deal with such circuit descriptions. The improvement method is implemented and inserted in a behavioral test pattern generator in order to be validated. Experimental results have been obtained which show the efficiency of our approach |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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