Characterization of surface topography of a newly developed metrological gloss scale
| Autor: | Guillaume Ged, Z. Silvestri, S. Källberg, Bengt-Göran Rosén, Olena Flys |
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| Jazyk: | angličtina |
| Rok vydání: | 2015 |
| Předmět: |
Engineering
Microscope business.industry Process Chemistry and Technology Mechanical engineering Surface finish Gloss (optics) Surfaces Coatings and Films Metrology law.invention Interferometry Optics law Naturvetenskap Materials Chemistry Surface roughness Reflectometry business Natural Sciences Instrumentation Hue |
| Popis: | In the European Joint Research Project 'Multidimensional Reflectometry for Industry', a new gloss scale was developed with the aim to represent different levels of gloss, hue, roughness, and refractive indices. In this paper, the surfaces of six selected samples were thoroughly investigated using various measuring techniques in order to verify the outcome of the novel manufacturing processes in terms of distinct levels as well as types of surface roughness. The aim of the evaluation was to capture surface structures in different wavelength intervals utilizing a confocal microscope, a coherence scanning interferometer, and an atomic force microscope. Power spectral density functions were also calculated from the measurements and used to determine suitability of techniques for different roughness scales. The measurements show that the expected surface characteristics as well as different RMS roughness values are intimately connected to the perceived glossiness. |
| Databáze: | OpenAIRE |
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