Streak camera measurement of subnanosecond plastic scintillator properties
| Autor: | E. M. Lent, R. A. Lerche, G. R. Tripp, J. C. Cheng, K. G. Tirsell |
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| Rok vydání: | 1978 |
| Předmět: |
Materials science
Streak camera business.industry X-Rays Doping Dose-Response Relationship Radiation Xerography Phosphor Scintillator Radiation Dosage Laser Sensitivity and Specificity law.invention Optics law Excited state Temporal resolution Materials Testing Nanotechnology Scintillation Counting Optoelectronics Radiometry business Plastics Instrumentation |
| Zdroj: | Review of Scientific Instruments. 49:650-653 |
| ISSN: | 1089-7623 0034-6748 |
| DOI: | 10.1063/1.1135476 |
| Popis: | A streak camera technique with temporal resolution of 20 ps has been used to measure the fluorescence properties of several subnanosecond plastic scintillators. The method employs a vacuum light pipe coupled to an optical streak camera. The scintillators are excited by a 200-ps x-ray pulse generated by a 1.06-microm Nd:YAG laser focused onto an iron target. The time history of the low-energy x-ray pulse is measured with an x-ray streak camera. Results are given for NElll plastic scintillators doped with benzophenone or acetophenone, for PVT doped with butyl-PBD, and for a ZnO phosphor doped with Ga. |
| Databáze: | OpenAIRE |
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