Transmission electron microscope specimen preparation for exploring the buried interfaces in plan view
Autor: | B. Pécz, G. Z. Radnóczi |
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Rok vydání: | 2006 |
Předmět: | |
Zdroj: | Journal of Microscopy. 224:328-331 |
ISSN: | 1365-2818 0022-2720 |
Popis: | A relatively easy and convenient process for the preparation of transmission electron microscope specimens of buried interfaces is described. The method is based on the alignment and realignment of the specimen rotation centre during ion milling. The ion-milling time interval in which good samples are obtained is substantially extended in this way. |
Databáze: | OpenAIRE |
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