Transmission electron microscope specimen preparation for exploring the buried interfaces in plan view

Autor:	B. Pécz, G. Z. Radnóczi
Rok vydání:	2006
Předmět:	Histology Materials science business.industry digestive oral and skin physiology technology industry and agriculture Nanotechnology Rotation Pathology and Forensic Medicine Optics Transmission electron microscopy Sample preparation Specimen preparation Ion milling machine business
Zdroj:	Journal of Microscopy. 224:328-331
ISSN:	1365-2818 0022-2720
Popis:	A relatively easy and convenient process for the preparation of transmission electron microscope specimens of buried interfaces is described. The method is based on the alignment and realignment of the specimen rotation centre during ion milling. The ion-milling time interval in which good samples are obtained is substantially extended in this way.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::dc23b5d7ed89203c7cadf2b8d96e8134 https://doi.org/10.1111/j.1365-2818.2006.01707.x Zobrazit plný text záznamu Plný text ve formátu PDF