Demonstration of atomic resolution Z-contrast imaging by a JEOL JEM-2010F scanning transmission electron microscope
| Autor: | E. M. James, Susanne Stemmer, Masahiro Kawasaki, Nigel D. Browning, Yan Xin, A. W. Nicholls |
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| Rok vydání: | 1998 |
| Předmět: |
Conventional transmission electron microscope
Scanning Hall probe microscope Microscope Materials science business.industry Low-voltage electron microscope Scanning confocal electron microscopy law.invention Optics law Scanning transmission electron microscopy Electron microscope business Instrumentation Environmental scanning electron microscope |
| Zdroj: | Scopus-Elsevier |
| ISSN: | 1477-9986 0022-0744 |
| DOI: | 10.1093/oxfordjournals.jmicro.a023629 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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