Thickness-Dependent Perovskite Octahedral Distortions at Heterointerfaces
| Autor: | Céline Lichtensteiger, Marta Gibert, Jennifer Fowlie, Jean-Marc Triscone, Hugo Meley, Philip R. Willmott |
|---|---|
| Přispěvatelé: | University of Zurich, Fowlie, Jennifer |
| Jazyk: | angličtina |
| Rok vydání: | 2019 |
| Předmět: |
Biaxial strain
3104 Condensed Matter Physics Materials science 530 Physics 2210 Mechanical Engineering 1600 General Chemistry Bioengineering 10192 Physics Institute 02 engineering and technology ddc:500.2 Epitaxy Perovskite law.invention law General Materials Science Thin film Perovskite (structure) Thickness dependent 1502 Bioengineering Condensed matter physics Strain (chemistry) Mechanical Engineering Structure General Chemistry 021001 nanoscience & nanotechnology Condensed Matter Physics 2500 General Materials Science Synchrotron X-ray diffraction Octahedron Nickelate Heterostructure 0210 nano-technology |
| Zdroj: | Nano Letters, Vol. 19, No 6 (2019) pp. 4188-4194 |
| ISSN: | 1530-6984 |
| Popis: | [Image: see text] In this study, we analyze how the octahedral tilts and rotations of thin films of LaNiO(3) and LaAlO(3) grown on different substrates, determined using synchrotron X-ray diffraction-measured half-integer Bragg peaks, depend upon the total film thickness. We find a striking difference between films grown on SrTiO(3) and LaAlO(3) substrates which appears to stem not only from the difference in epitaxial strain state but also from the level of continuity at the heterointerface. In particular, the chemically and structurally discontinuous LaNiO(3)/SrTiO(3) and LaAlO(3)/SrTiO(3) interfaces cause a large variation in the octahedral network as a function of film thickness whereas the rather continuous LaNiO(3)/LaAlO(3) interface seems to allow from just a few unit cells the formation of a stable octahedral pattern corresponding to that expected only given the applied biaxial strain. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|