Assessment of an analytical expression for an evaporation duct refractivity profile
| Autor: | Jacques Claverie, Yvonick Hurtaud |
|---|---|
| Přispěvatelé: | Institut d'Électronique et des Technologies du numéRique (IETR), Université de Nantes (UN)-Université de Rennes (UR)-Institut National des Sciences Appliquées - Rennes (INSA Rennes), Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-CentraleSupélec-Centre National de la Recherche Scientifique (CNRS), DGA Maîtrise de l'information (DGA.MI), Direction générale de l'Armement (DGA), Nantes Université (NU)-Université de Rennes 1 (UR1), Université de Rennes (UNIV-RENNES)-Université de Rennes (UNIV-RENNES)-Institut National des Sciences Appliquées - Rennes (INSA Rennes), Institut National des Sciences Appliquées (INSA)-Université de Rennes (UNIV-RENNES)-Institut National des Sciences Appliquées (INSA)-CentraleSupélec-Centre National de la Recherche Scientifique (CNRS), Université de Nantes (UN)-Université de Rennes 1 (UR1) |
| Jazyk: | angličtina |
| Rok vydání: | 2017 |
| Předmět: |
Evaporation duct
020208 electrical & electronic engineering X band 020206 networking & telecommunications 02 engineering and technology Expression (mathematics) Computational physics law.invention [SPI]Engineering Sciences [physics] law Surface boundary layer [SDE]Environmental Sciences 0202 electrical engineering electronic engineering information engineering 14. Life underwater Radar Geology ComputingMilieux_MISCELLANEOUS Remote sensing |
| Zdroj: | IEEE AP-S and URSI Symposium IEEE AP-S and URSI Symposium, Jul 2017, San Diego, United States |
| Popis: | The prediction of radar coverage for systems operating within or near the Marine Surface Boundary Layer (MSBL) requires the knowledge of the vertical refractivity profile. This vertical profile and the corresponding evaporation duct height are generally computed by the means of semi-empirical “bulk” models. Nevertheless, for practical purposes, it could appear very useful to describe the refractivity profile with an analytical expression. The “classical” log-linear law that has been widely used during the past decades has recently been modified and improved. This paper discusses the ability of this new expression to match a physical “bulk” model. Our study concerns both simulated vertical profiles and some corresponding propagation results in X band. |
| Databáze: | OpenAIRE |
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