Thermally Induced Parametric Instability in a Back-Action Evading Measurement of a Micromechanical Quadrature near the Zero-Point Level

Autor: A. J. Weinstein, Junho Suh, Matthew D. Shaw, Keith Schwab, H. G. LeDuc
Rok vydání: 2012
Předmět:
Zdroj: Nano Letters. 12:6260-6265
ISSN: 1530-6992
1530-6984
Popis: We report the results of back-action evading experiments utilizing a tightly coupled electro-mechanical system formed by a radio frequency micromechanical resonator parametrically coupled to a NbTiN superconducting microwave resonator. Due to excess dissipation in the microwave resonator, we observe a parametric instability induced by a thermal shift of the mechanical resonance frequency. In light of these measurements, we discuss the constraints on microwave dissipation needed to perform BAE measurements far below the zero-point level.
Databáze: OpenAIRE