Thermally Induced Parametric Instability in a Back-Action Evading Measurement of a Micromechanical Quadrature near the Zero-Point Level
Autor: | A. J. Weinstein, Junho Suh, Matthew D. Shaw, Keith Schwab, H. G. LeDuc |
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Rok vydání: | 2012 |
Předmět: | |
Zdroj: | Nano Letters. 12:6260-6265 |
ISSN: | 1530-6992 1530-6984 |
Popis: | We report the results of back-action evading experiments utilizing a tightly coupled electro-mechanical system formed by a radio frequency micromechanical resonator parametrically coupled to a NbTiN superconducting microwave resonator. Due to excess dissipation in the microwave resonator, we observe a parametric instability induced by a thermal shift of the mechanical resonance frequency. In light of these measurements, we discuss the constraints on microwave dissipation needed to perform BAE measurements far below the zero-point level. |
Databáze: | OpenAIRE |
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