Imaging the potential distribution of individual charged impurities on graphene by low-energy electron holography

Autor: Hans-Werner Fink, Conrad Escher, Tatiana Latychevskaia, Flavio Wicki
Přispěvatelé: University of Zurich, Latychevskaia, Tatiana
Rok vydání: 2017
Předmět:
Physics - Instrumentation and Detectors
Materials science
Distribution (number theory)
530 Physics
Holography
FOS: Physical sciences
10192 Physics Institute
02 engineering and technology
Electron
3107 Atomic and Molecular Physics
and Optics

01 natural sciences
Electron holography
law.invention
law
Impurity
Mesoscale and Nanoscale Physics (cond-mat.mes-hall)
0103 physical sciences
010306 general physics
High-resolution transmission electron microscopy
Instrumentation
Condensed Matter - Materials Science
Condensed Matter - Mesoscale and Nanoscale Physics
Graphene
3105 Instrumentation
Materials Science (cond-mat.mtrl-sci)
2504 Electronic
Optical and Magnetic Materials

Instrumentation and Detectors (physics.ins-det)
021001 nanoscience & nanotechnology
Atomic and Molecular Physics
and Optics

Electronic
Optical and Magnetic Materials

Atomic physics
0210 nano-technology
Phase retrieval
Zdroj: Ultramicroscopy. 182:276-282
ISSN: 0304-3991
DOI: 10.1016/j.ultramic.2017.07.019
Popis: While imaging individual atoms can routinely be achieved in high resolution transmission electron microscopy, visualizing the potential distribution of individually charged adsorbates leading to a phase shift of the probing electron wave is still a challenging task. Low-energy electrons (30 – 250 eV) are sensitive to localized potential gradients. We employed low-energy electron holography to acquire in-line holograms of individual charged impurities on free-standing graphene. By applying an iterative phase retrieval reconstruction routine we recover the potential distribution of the localized charged impurities present on free-standing graphene.
Databáze: OpenAIRE