On Peculiarities of $S$-Parameter Measurements
| Autor: | W. Van Moer, Yves Rolain, Jeffrey A. Jargon, D.C. DeGroot |
|---|---|
| Rok vydání: | 2007 |
| Předmět: |
Physics
Engineering business.industry Connection (vector bundle) Computer Science::Software Engineering Omega Characteristic impedance Connection (mathematics) Computational physics Image (mathematics) Electric power transmission Quality (physics) Transmission line Electronic engineering Scattering parameters Radio frequency Statistical physics Electrical and Electronic Engineering Propagation constant business Instrumentation |
| Zdroj: | IEEE Transactions on Instrumentation and Measurement. 56:1967-1972 |
| ISSN: | 0018-9456 |
| DOI: | 10.1109/tim.2007.895581 |
| Popis: | Extracting quantities, such as the propagation factor or the characteristic impedance of a transmission line based on measured S-parameters, can be more involved than expected. Experience teaches that even if the S-parameter measurements look smooth and are of good quality, the derived quantities can contain large spikes that tend to grow when connection imperfections are present. In this paper, the presence of the peaks is shown in practical measurements, a possible explanation for their presence is provided, and a sensitive indicator (the image parameters) for the imperfections is proposed. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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