Intermixing in Cu/Co: molecular dynamics simulations and Auger electron spectroscopy depth profiling
| Autor: | Miklós Menyhárd, Péter Süle |
|---|---|
| Rok vydání: | 2006 |
| Předmět: |
Auger electron spectroscopy
Condensed Matter - Materials Science Radiation Chemistry Materials Science (cond-mat.mtrl-sci) FOS: Physical sciences Condensed Matter Physics Molecular physics Molecular dynamics Condensed Matter::Materials Science General Materials Science Atomic physics Thin film Ion sputtering Computer Science::Databases |
| DOI: | 10.48550/arxiv.cond-mat/0605130 |
| Popis: | The ion-bombardment induced evolution of intermixing is studied by molecular dynamics simulations and by Auger electron spectroscopy depth profiling analysis (AESD) in Cu/Co multilayer. It has been shown that from AESD we can derive the low-energy mixing rate and which can be compared with the simulated values obtained by molecular dynamics (MD) simulations. The overall agreement is reasonably good hence MD can hopefuly be used to estimate the rate of intermixing in various interface systems. Comment: 3 pages, 2 figures |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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