Role of carbon in dynamic effects and reliability of 0.15-um AlGaN/GaN HEMTs for RF power amplifiers

Autor:	Carlo De Santi, Enrico Zanoni, Matteo Meneghini, Gaudenzio Meneghesso, Fabiana Rampazzo, Veronica Zhan Gao, Chandan Sharma, Francesca Chiocchetta, Giovanni Verzellesi, Alessandro Chini, Marcello Cioni, Nicolò Zagni, Claudio Lanzieri, Alessio Pantellini, Marco Peroni, Luca Latessa
Jazyk:	angličtina
Rok vydání:	2022
Předmět:	GaN HEMT step stress carbon doping hot electrons
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d917a9cfbb62a2fdca61da5581677832 https://hdl.handle.net/11380/1268486 Zobrazit plný text záznamu