A peak position comparison method for high-speed quantitative Laue microdiffraction data processing
Autor: | Nobumichi Tamura, Kai Chen, Jiawei Kou |
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Rok vydání: | 2018 |
Předmět: |
3d printed
Materials science Phase (waves) 02 engineering and technology Polychromatic X-ray Laue microdiffraction 01 natural sciences law.invention Optics law Position (vector) 0103 physical sciences Orientation mapping General Materials Science Plastic deformation Materials 010302 applied physics Phase distribution Data processing business.industry Mechanical Engineering Search engine indexing Metals and Alloys Materials Engineering 021001 nanoscience & nanotechnology Condensed Matter Physics Laser Synchrotron Superalloy Mechanics of Materials 0210 nano-technology business |
Zdroj: | Kou, J; Chen, K; & Tamura, N. (2018). A peak position comparison method for high-speed quantitative Laue microdiffraction data processing. Scripta Materialia, 143, 49-53. doi: 10.1016/j.scriptamat.2017.09.005. Lawrence Berkeley National Laboratory: Retrieved from: http://www.escholarship.org/uc/item/62v7j1rn |
ISSN: | 1359-6462 |
DOI: | 10.1016/j.scriptamat.2017.09.005 |
Popis: | © 2017 Acta Materialia Inc. Indexing Laue patterns of a synchrotron microdiffraction scan can take as much as ten times longer than collecting the data, impeding efficient structural analysis using this technique. Here a novel strategy is developed. By comparing the peak positions of adjacent Laue patterns and checking the intensity sequence, grain and phase boundaries are identified, requiring only a limited number of indexing steps for each individual grain. Using this protocol, the Laue patterns can be indexed on the fly as they are taken. The validation of this method is demonstrated by analyzing the microstructure of a laser 3D printed multi-phase/multi-grain Ni-based superalloy. |
Databáze: | OpenAIRE |
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