A peak position comparison method for high-speed quantitative Laue microdiffraction data processing

Autor: Nobumichi Tamura, Kai Chen, Jiawei Kou
Rok vydání: 2018
Předmět:
Zdroj: Kou, J; Chen, K; & Tamura, N. (2018). A peak position comparison method for high-speed quantitative Laue microdiffraction data processing. Scripta Materialia, 143, 49-53. doi: 10.1016/j.scriptamat.2017.09.005. Lawrence Berkeley National Laboratory: Retrieved from: http://www.escholarship.org/uc/item/62v7j1rn
ISSN: 1359-6462
DOI: 10.1016/j.scriptamat.2017.09.005
Popis: © 2017 Acta Materialia Inc. Indexing Laue patterns of a synchrotron microdiffraction scan can take as much as ten times longer than collecting the data, impeding efficient structural analysis using this technique. Here a novel strategy is developed. By comparing the peak positions of adjacent Laue patterns and checking the intensity sequence, grain and phase boundaries are identified, requiring only a limited number of indexing steps for each individual grain. Using this protocol, the Laue patterns can be indexed on the fly as they are taken. The validation of this method is demonstrated by analyzing the microstructure of a laser 3D printed multi-phase/multi-grain Ni-based superalloy.
Databáze: OpenAIRE