Generic Electrostatic Discharges Protection Solutions for RF and Millimeter-Wave Applications

Autor: Philippe Galy, Jean-Michel Fournier, T. Lim, Philippe Benech, Johan Bourgeat, Boris Heitz, Jean Jimenez
Přispěvatelé: Publica
Jazyk: angličtina
Rok vydání: 2015
Předmět:
Popis: The vertical shrinkage of the advanced CMOS processes thicknesses makes electrostatic discharge (ESD) issues become more significant. RF and millimeter-wave (mm-wave) circuits are very sensitive to the ESD components’ capacitive parasitic effect. Surface area is a key factor as well in an ESD protection circuit for mm-wave applications. This paper presents silicon-verified ESD solutions, which fulfill physical dimensions, ESD robustness, and broadband frequencies requirements.
Databáze: OpenAIRE