Stray Voltage Capture for Robust and Ultra-Fast Short Circuit Detection in Power Electronics with Half-Bridge Structure

Autor: Henk Huisman, Jeroen van Duivenbode, Darian Verdy Retianza
Přispěvatelé: Electromechanics and Power Electronics, Power Electronics Lab, EIRES System Integration
Jazyk: angličtina
Rok vydání: 2020
Předmět:
Zdroj: 2020 22nd European Conference on Power Electronics and Applications, EPE 2020 ECCE Europe, 1-10
STARTPAGE=1;ENDPAGE=10;TITLE=2020 22nd European Conference on Power Electronics and Applications, EPE 2020 ECCE Europe
DOI: 10.23919/EPE20ECCEEurope43536.2020.9215633
Popis: This paper proposes a robust and ultra-fast short circuit detection method based on the voltage dip on the half-bridge due to the presence of stray inductance. Results show that the short circuit is detected in less than 200ns, which is a promising solution against the Single-Event Burnout failure type occurrence.
Databáze: OpenAIRE