Interferometric Imaging of Solvent Vapor of Evaporating Liquid Films
| Autor: | Felix Braig, Florian Narrog, Hans Martin Sauer, Edgar Dörsam |
|---|---|
| Rok vydání: | 2021 |
| Předmět: |
Materials science
Evaporation 02 engineering and technology 010402 general chemistry 01 natural sciences law.invention Physics::Fluid Dynamics law Electrochemistry Deposition (phase transition) General Materials Science Thin film Spectroscopy Natural convection business.industry Michelson interferometer Surfaces and Interfaces 021001 nanoscience & nanotechnology Condensed Matter Physics Laser 0104 chemical sciences Condensed Matter::Soft Condensed Matter Solvent Interferometry Optoelectronics 0210 nano-technology business |
| Zdroj: | Langmuir : the ACS journal of surfaces and colloids. 37(17) |
| ISSN: | 1520-5827 |
| Popis: | The liquid deposition of thin films requires a thorough understanding of the underlying drying process, as it is an essential subprocess, where many defects may arise. To complement experimental studies, the present study uses a laser Michelson interferometer to visualize the vapor cloud of evaporating liquid films. The recorded interferometric patterns are evaluated using windowed Fourier filtering and a novel phase-unwrapping algorithm to allow for a robust analysis. Thin solvent stripes of different lengths are combined to yield a quantitative two-dimensional distribution of the solvent vapor concentration along a thin liquid stripe. The results show a considerable influence of natural convection during evaporation. |
| Databáze: | OpenAIRE |
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