VNA-Based Material Characterization in THz Domain without Classic Calibration and Time-Gating
| Autor: | Alireza Kazemipour, Johannes Hoffmann, Markus Zeier, Juerg Ruefenacht, Daniel Stalder, Michael Wollensack, Martin Hudlicka, Djamel Allal |
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| Rok vydání: | 2020 |
| Předmět: |
parameter extraction
Physics Normalization (statistics) Permittivity Terahertz radiation Acoustics 020208 electrical & electronic engineering material characterization 02 engineering and technology Metrology Time gating measurement uncertainty 0202 electrical engineering electronic engineering information engineering Calibration Measurement uncertainty VNA time-gating RF metrology |
| Zdroj: | 2020 Conference on Precision Electromagnetic Measurements (CPEM). |
| DOI: | 10.1109/cpem49742.2020.9191818 |
| Popis: | A method is presented to measure materials and extract the complex permittivity without using classic VNA calibrations and time-gating. It is based on normalization to a "Thru" connection and analyzing error-terms and multiple-reflection phenomena. Measurement results (in free-space) are presented in 75-110 GHz and 500-750 GHz bands. Normalization technique can reduce the overall measurement uncertainties and simplify the material characterization process. This work was supported by the European Metrology Programme for Innovation and Research (EMPIR), under 18SIB09-TEMMT project. EMPIR programme is co-financed by the Participating States and from the European Union's Horizon 2020 Research and Innovation Programme. |
| Databáze: | OpenAIRE |
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