Ronchi and Moiré patterns for testing spherical and aspherical surfaces using deflectometry
| Autor: | Alberto Jaramillo-Núñez, J. A. Arriaga-Hernández |
|---|---|
| Rok vydání: | 2019 |
| Předmět: |
Wavefront
Physics Zernike polynomials business.industry 02 engineering and technology Radius Moiré pattern 021001 nanoscience & nanotechnology Curvature 01 natural sciences Atomic and Molecular Physics and Optics Ronchi test Standard deviation 010309 optics symbols.namesake Optics 0103 physical sciences symbols Moire deflectometry Electrical and Electronic Engineering 0210 nano-technology business Engineering (miscellaneous) |
| Zdroj: | Applied optics. 57(34) |
| ISSN: | 1539-4522 |
| Popis: | The aim of this paper is to compare the Ronchi test and the Moire deflectometry applied to a new pattern. To do so, we used two Ronchi patterns (typical Ronchigrams) produced by two identical Ronchi rulings angularly displaced and placed close to the curvature radius of a mirror. The result obtained by superposing both Ronchigrams is our new pattern, a Moire pattern of the Ronchigram (Moire-Ronchigram). The Zernike aberration polynomial coefficients of the tridimensional wavefront for both mirrors are obtained as a result. We also compared the Zernike coefficients obtained for each of the mentioned techniques and we found that the results with less dispersion are those where Moire deflectometry was applied. Finally, as a confidence test for applying and testing the Moire-Ronchigram, we compare our results with Open Fringe, FringeXP, and APEX, using the root-mean-square and standard deviation values. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|