Comment on the paper: H.-E. Hwang, P. Han, Theoretical analysis for surface tilt and translation detection based on speckle photography in the Fresnel domain, Opt. Commun. 282 (2009) 351–354

Autor:	Bryan M. Hennelly, Jennifer E. Ward, John T. Sheridan, Damien P. Kelly
Jazyk:	angličtina
Rok vydání:	2009
Předmět:	Surface (mathematics) business.industry 02 engineering and technology 021001 nanoscience & nanotechnology Translation (geometry) 01 natural sciences Atomic and Molecular Physics and Optics Domain (mathematical analysis) Electronic Optical and Magnetic Materials 010309 optics Speckle pattern Tilt (optics) Optics Speckle photography 0103 physical sciences Computer Science Electrical and Electronic Engineering Physical and Theoretical Chemistry 0210 nano-technology business Electronic Engineering Fresnel transform
Zdroj:	Optics Communications
Popis:	In a recent paper [H.-E. Hwang, P. Han, Opt. Commun. 282 (2009) 351] a speckle based metrology system is proposed which it is claimed provides significant advantages over existing systems. In this paper, we show that the discussion presented in [H.-E. Hwang, P. Han, Opt. Commun. 282 (2009) 351] is deficient, and that several of the statements made are incorrect and/or misleading.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d45bd20655d74f4999e9d6567a684e4a http://eprints.maynoothuniversity.ie/5766/ Zobrazit plný text záznamu