Test Generation for Digital Hardware Based on High-Level Models
| Autor: | M.S. Lebedev, A.S. Kamkin, M M Chupilko, Sergey Smolov |
|---|---|
| Rok vydání: | 2017 |
| Předmět: |
Model checking
Dead code дерево распространения Computer science производственное тестирование цифровая аппаратура lcsh:QA75.5-76.95 Fault detection and isolation System model высокоуровневая решающая диаграмма General Environmental Science computer.programming_language язык описания аппаратуры business.industry Extended finite-state machine Hardware description language проверка модели Stuck-at fault расширенный конечный автомат Fault coverage General Earth and Planetary Sciences константная ошибка lcsh:Electronic computers. Computer science business computer Computer hardware |
| Zdroj: | Труды Института системного программирования РАН, Vol 29, Iss 4, Pp 247-256 (2018) |
| ISSN: | 2220-6426 2079-8156 |
| DOI: | 10.15514/ispras-2017-29(4)-16 |
| Popis: | Hardware testing is a process aimed at detecting manufacturing faults in integrated circuits. To measure test quality, two main metrics are in use: fault detection abilities (fault coverage) and test application time (test length). Many algorithms have been suggested for test generation; however, no scalable solution exists. In this paper, we analyze applicability of functional tests generated from high-level models for low-level manufacturing testing. A particular test generation method is considered. The input information is an HDL description. The key steps of the method are system model construction and coverage model construction. Both models are automatically extracted from the given description. The system model is a representation of the design in the form of high-level decision diagrams. The coverage model is a set of LTL formulae defining reachability conditions for the transitions of the extended finite state machine. The models are translated into the input format of a model checker. For each coverage model formula the model checker generates a counterexample, i.e. an execution that violates the formula (makes the corresponding transition to fire). The approach is intended for covering of all possible execution paths of the input HDL description and detecting dead code. Experimental comparison with the existing analogues has shown that it produces shorter tests, but they achieve lower stuck-at fault coverage comparing with the dedicated approach. An improvement has been proposed to overcome the issue. |
| Databáze: | OpenAIRE |
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