Modification of Silver/Single-Wall Carbon Nanotube Electrical Contact Interfaces via Ion Irradiation
| Autor: | Jamie E. Rossi, Cory D. Cress, Andrew Merrill, Aaron D. Franklin, Nathanael D. Cox, Brian J. Landi, Ivan Puchades |
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| Rok vydání: | 2017 |
| Předmět: |
010302 applied physics
Materials science Contact resistance Analytical chemistry Nanotechnology 02 engineering and technology Carbon nanotube 021001 nanoscience & nanotechnology 01 natural sciences Electrical contacts Ion law.invention symbols.namesake law 0103 physical sciences Electrode symbols General Materials Science Irradiation Thin film 0210 nano-technology Raman spectroscopy |
| Zdroj: | ACS applied materialsinterfaces. 9(8) |
| ISSN: | 1944-8252 |
| Popis: | Introduction of defects via ion irradiation ex situ to modify silver/single-wall carbon nanotube (Ag-SWCNT) electrical contacts and the resulting changes in the electrical properties were studied. Two test samples were fabricated by depositing 0.1 μm Ag onto SWCNT thin films with average thicknesses of 10 and 60 nm, followed by ion irradiation (150 keV 11B+ at 5 × 1014 ions/cm2). The contact resistance (Rc) between the Ag and SWCNT thin films was determined using transfer length method (TLM) measurements before and after ion irradiation. Rc increases for both test samples after irradiation, while there is no change in Rc for control structures with thick Ag contacts (1.5 μm), indicating that changes in Rc originate from changes in the SWCNT films and at the Ag-SWCNT interface caused by ion penetration through the Ag contact electrodes. Rc increases by ∼4× for the 60 nm SWCNT structure and increases by ∼2.4× for the 10 nm SWCNT structure. Raman spectroscopy measurements of the SWCNTs under the contacts com... |
| Databáze: | OpenAIRE |
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