Dielectric Permittivity Sensor Based on Planar Open-Loop Resonator
Autor: | Anyela Aquino, Carlos G. Juan, Benjamin Potelon, Cédric Quendo |
---|---|
Přispěvatelé: | Laboratoire des sciences et techniques de l'information, de la communication et de la connaissance (Lab-STICC), École Nationale d'Ingénieurs de Brest (ENIB)-Université de Bretagne Sud (UBS)-Université de Brest (UBO)-École Nationale Supérieure de Techniques Avancées Bretagne (ENSTA Bretagne)-Institut Mines-Télécom [Paris] (IMT)-Centre National de la Recherche Scientifique (CNRS)-Université Bretagne Loire (UBL)-IMT Atlantique Bretagne-Pays de la Loire (IMT Atlantique), Institut Mines-Télécom [Paris] (IMT), Hospital Son Dureta |
Jazyk: | angličtina |
Rok vydání: | 2021 |
Předmět: |
Permittivity
[PHYS]Physics [physics] Open loop resonator Materials science business.industry 010401 analytical chemistry 020206 networking & telecommunications 02 engineering and technology Substrate (electronics) Dielectric 01 natural sciences Sample (graphics) 0104 chemical sciences Characterization (materials science) [SPI]Engineering Sciences [physics] Planar 0202 electrical engineering electronic engineering information engineering Optoelectronics Electrical and Electronic Engineering business Instrumentation Microwave ComputingMilieux_MISCELLANEOUS |
Zdroj: | IEEE Sensors Letters IEEE Sensors Letters, IEEE, 2021, 5 (3), pp.1-4. ⟨10.1109/LSENS.2021.3055544⟩ |
ISSN: | 2475-1472 |
Popis: | Accurate characterization of the dielectric properties of solids and, especially, substrates is crucial for circuitry design and development. For applications requiring low cost, wieldy systems, many attempts have been made involving planar resonant microwave devices. However, most of them have a configuration in which the sample is placed onto the substrate. As a novelty, a structure considering the sample placement into a more sensitive area is presented and analyzed in this letter. The design of this kind of sensors is discussed, and the measurement results are presented. The proposed device is shown to be capable of measuring the full complex permittivity of the sample, and the results compare well with other previous attempts. |
Databáze: | OpenAIRE |
Externí odkaz: |