Ptychographic Nano-Analytical Microscope (PtyNAMi) at PETRA III: signal-to-background optimization for imaging with high sensitivity

Autor: Felix Wittwer, Stephan Botta, Dennis Brückner, Martin Seyrich, Dorota Koziej, Christian G. Schroer, Ralph Döhrmann, Gerald Falkenberg, Andreas Schropp, Lukas Grote, Jan Garrevoet, Maik Kahnt, Patrik Wiljes
Přispěvatelé: Lai, Barry, Somogyi, Andrea
Jazyk: angličtina
Rok vydání: 2019
Předmět:
Zdroj: Proceedings of SPIE 11112, 111120D-1 (2019). doi:10.1117/12.2529096
X-Ray Nanoimaging: Instruments and Methods IV, San Diego, United States, 2019-08-11-2019-08-15
DOI: 10.3204/pubdb-2019-03577
Popis: X-Ray Nanoimaging: Instruments and Methods IV, San Diego, United States, 11 Aug 2019 - 15 Aug 2019; Proceedings of SPIE 11112, 111120D-1 (2019). doi:10.1117/12.2529096
The X-ray scanning microscope PtyNAMi at beamline P06 of PETRA III at DESY in Hamburg, Germany, isdesigned for high-spatial-resolution 3D imaging with high sensitivity. Besides optimizing the coherent ux densityon the sample and the precision mechanics of the scanner, special care has been taken to reduce backgroundsignals on the detector. The optical path behind the sample is evacuated up until the sensor of a four-megapixeldetector that is placed into the vacuum. In this way, parasitic scattering from air and windows close to thedetector is avoided. The instrument has been commissioned and is in user operation. The main commissioningresults of the low-background detector system are presented. A signal-to-noise model for small object details isderived that includes incoherent background scattering
Published by SPIE, Bellingham, Wash.
Databáze: OpenAIRE