MOMBE selective infill growth of InP/GaInAs for quantum dot formation
Autor: | Dieter Bimberg, G Urmann, S. Schelhase, S Thiel, R. Gibis, Harald Künzel, R. Steingruber, O. Stier |
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Přispěvatelé: | Publica |
Rok vydání: | 2000 |
Předmět: |
iii-v semiconductors
edge effects molecular beam epitaxial growth quantum dot formation metalorganic molecular beam epitaxy Epitaxy semiconductor quantum dots Inorganic Chemistry electron beam lithography Optics 30 to 100 nm InP-(gain)As Materials Chemistry epitaxial infill regrowth vertical growth rate Reactive-ion etching Quantum well selective infill growth business.industry Chemistry sputter etching semiconductor epitaxial layers reactive ion etching coherent growth effects Condensed Matter::Mesoscopic Systems and Quantum Hall Effect Condensed Matter Physics gallium arsenide semiconductor growth Blueshift indium compounds quantum wells Quantum dot SEM Optoelectronics photoluminescence Light emission hole array business scanning electron microscopy Electron-beam lithography Molecular beam epitaxy |
Zdroj: | Journal of Crystal Growth. 209:499-503 |
ISSN: | 0022-0248 |
DOI: | 10.1016/s0022-0248(99)00605-3 |
Popis: | Quantum dots based on InP/GaInAs quantum wells were realised using epitaxial infill regrowth into a hole array formed in InP by means of e-beam lithography and reactive ion etching. Metal organic molecular beam epitaxy has been applied for selective infill growth. The growth procedure has been elaborated such that the vertical growth rate in predefined holes agrees with coherent growth and edge effects are minimised. Quantum dots formed in holes with a diameter ranging from 60 nm down to 30 nm in combination with a periodicity of 100 nm were studied. The achievement of quantum dots was evidenced by a blue shift of light emission with decreasing the geometrical quantum dot diameter, in qualitative agreement with calculations. Quantitative discrepancies were found because the effective lateral diameter of the quantum dots proved to be smaller than the geometrical value of the etched holes, caused by the lateral growth of the lower InP barrier. |
Databáze: | OpenAIRE |
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